keennax.blogg.se

Xps peak software
Xps peak software









xps peak software

Tomorrow I'm actually going Elk hunting (with the camera) as it's peak rutting season right now. The WA Forest Service, Mt Rainier Paradise Visitors Center Store and others buys my photo's as well. I've been doing wildlife, birds, nature, mountain lakes photography seriously since 1971 and my Dad and Grandpa did it for a living as well, so it runs in the family. My Uncle wanted me to do that and was going to fund it but he passed away last month Here is a website I did in memory of him as he died while we were on vacation at that very same lake you saw that I'm putting on my laptop. I've thought about starting one for my photos, but it takes $$$ to rent the space, then getting all the photos printed and mounted to hang on the walls. I don't know about galleries on East Coast here, but on the West Coast your lucky to find one in any given city. Are those just galleries for show or do they sell the them as well? The software is useful to isolate those effects in XPS spectra which are caused by the electron configurartion.įor peak intensity determination using different backgroundsĪll softwares run under Windows (XP, Vista, Win7, Win10 etc).Click to expand.I didn't know that. it calculates the intrinsic and extrinsic effects). Software to calculate the energy loss structure caused by the effect of the core-hole, the passage through the surface and the transport effects in XPS (i.e. Calculates also the surface effects in the IMFPįor calculation of inelastic electron mean free paths by the TPP2M- formula Software to determine the optical and dielectric properties of nano-thin films from REELS. For quantitative XPS or AES analysis of three dimensional surface nano-structures from analysis of the XPS-peak shapeįor quantitative angle resolved analysis by XPS or AES from analysis of the variation in peak intensity with angle of emissionįor quantitative determination of the effective inelastic electron scattering cross section of materials and nano-films by analysis of REELS











Xps peak software